July 2011 meeting
Monday 11 Jul 2011, 13:00
→
14:00
US/Central
1
Atomic-Scale Characterization of SRF Niobium Using UV Laser-Assisted Local-Electrode Atom-Probe Tomography
Speaker
:
Seidman
Slides
2
Related material
a) Dislocation etch pits
Speaker
:
Zhao
Slides