Cold Electronics Review

Name: Cold Electronics Review
Start: 2016-10-12T08:00:00-04:00
End: 2016-10-14T14:30:00-04:00
Location: BNL Instrumentation

12–14 Oct 2016

BNL Instrumentation

US/Eastern timezone

FE and ADC ASIC Testing Summary

12 Oct 2016, 14:30

30m

Large Conference Room (BNL Instrumentation)

Building 535

Plenary

Dr Shanshan Gao (Brookhaven National Laboratory)

Slides

BNLTestStand.20161011_v2.9.pdf