2–4 Dec 2014
Argonne National Laboratory
US/Central timezone
Microchannel plate (MCP) based detectors have unique properties and exquisite sensitivity which make them the detectors of choice for a range of scientific disciplines. Areas of application include time-of-flight measurements, x-ray science, imaging spectroscopy, electron spectroscopy, mass spectrometry and astronomy. Microchannel plates are used in photon detectors, night vision devices, and national security applications. The emergence of atomic layer deposition (ALD) methods for MCP manufacturing has improved device performance and offers a direct path to large areas and easy customization. This workshop seeks to bring together experts in MCP-based detectors to evaluate the state-of-the-art of the technology in the various applications, to exchange new developments, and to explore ways to push the boundaries of MCP-based detector performance parameters, such as lifetime, uniformity, dark count, and spatial and temporal resolution.
Starts
Ends
US/Central
Argonne National Laboratory
A-224
9700 S. Cass Avenue, Building 360 Lemont, IL 60439