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21–26 Jul 2024
NIU Naperville Conference Center
US/Central timezone

Beam position monitor for high intensity environments

22 Jul 2024, 18:00
1h 30m
NIU Naperville Conference Center

NIU Naperville Conference Center

1120 E. Diehl Road, Ste 150, Naperville IL 60563

Speaker

Loic Amoudry

Description

A novel diagnostic based on the well-established electro-optic sampling (EOS) technique is adaptable for non-interceptive, ultrafast position monitoring for high-intensity femtosecond beams. By using two pairs of crystals, the EOS system can also reveal the e-beam’s transverse position with ultrafast temporal resolution. This configuration is informally called the electro-optic sampling beam position monitor (EOS-BPM). In comprehensive application, the EOS-BPM can yield the full 3D centroid positioning of two bunches in a wakefield accelerator, or the tilt of a beam used to power a light source. Under ideal conditions, simulation-based estimates show that this device may be able to achieve temporal and transverse resolution for the beam centroid positions of a two-bunch wakefield accelerator beam of order 50 fs and 1 μm, respectively. An initial prototype of the EOS-BPM using only 1 pair of crystals, called 2D EOS-BPM has already been conceptually developed and is currently installed at the SLAC FACET-II facility. We improved its design and showed efficiency and reliability of our optimization by running benchtop tests. We also designed a prototype EOS-BPM using 2 pairs of crystals and extended our work to build a first version of it, proving its mechanical and optical functionality.

Working group WG5 : Beam sources, monitoring and control

Primary authors

Loic Amoudry Tara Hodgetts (RadiaBeam) Gerard Andonian (Radiabeam) Michael Litos (University of Colorado Boulder) Claire Hansel (University of Colorado Boulder)

Presentation materials

There are no materials yet.