Speaker
Dr
Birgit Kindler
(GSI Helmholtz Centre for Heavy-Ion Research)
Description
For characterization of targets and foils prepared at the target laboratory as well as for characterization of e.g. degrader or windows of internal customers different analytical devices are available. Besides a lot of standard the target laboratory of GSI holds a 3D-measurement system (MicroProf®) equipped with optical sensors for measuring surface parameter as well as total thickness variations contact-free.
In the talk the measuring principle as well as the possibilities and features of the MicroProf®-system are explained and some different applications are shown.
Primary author
Dr
Birgit Kindler
(GSI Helmholtz Centre for Heavy-Ion Research)
Co-authors
Annett Huebner
(GSI Helmholtz Centre for Heavy-Ion Research)
Dr
Bettina Lommel
(GSI Helmholtz Centre for Heavy-Ion Research)
Elif Celik Ayik
(GSI Helmholtz Centre for Heavy-Ion Research)
Jutta Steiner
(GSI Helmholtz Centre for Heavy-Ion Research)
Vera Yakusheva
(GSI Helmholtz Centre for Heavy-Ion Research)